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| author | Hirokazu Honda <hiroh@chromium.org> | 2021-10-04 15:58:56 +0900 |
|---|---|---|
| committer | Laurent Pinchart <laurent.pinchart@ideasonboard.com> | 2021-10-05 03:30:36 +0300 |
| commit | 3c059b9164fdbe8188eaa466fe64f7f680c0843b (patch) | |
| tree | 5e9638bbb3885801ab47f0fa0f76a494890e757f /include/android/hardware/libhardware | |
| parent | f0139ed11ae7c7afeae8fa4a2a5c5d7aa9cddc5f (diff) | |
libcamera: camera_sensor: Reverse the key and value of test pattern mode map
The key and value of the test pattern mode are originally the index of
v4l2 control and the corresponding test pattern mode control value.
This key and value are useful in the initialization for reporting
available test pattern modes. However, the map of the reversed key and
value is much more useful in applying a requested test pattern mode.
Reverses the key and value of the map as the initialization is one
time but the test pattern mode request will be multiple times.
Signed-off-by: Hirokazu Honda <hiroh@chromium.org>
Reviewed-by: Jacopo Mondi <jacopo@jmondi.org>
Reviewed-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Signed-off-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Diffstat (limited to 'include/android/hardware/libhardware')
0 files changed, 0 insertions, 0 deletions